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Teraoka, Yuden; Iwai, Yutaro*; Okada, Ryuta; Yoshigoe, Akitaka
no journal, ,
no abstracts in English
Oka, Kiyoshi; Seki, Takeshi*
no journal, ,
no abstracts in English
Abe, Shinichiro; Sato, Tatsuhiko
no journal, ,
Neutron-induced soft error in a NMOSFET is analyzed based on the multiple sensitive volume (MSV) model using the PHITS code. The result is compared with those obtained by PHYSERD based on event-by-event TCAD simulation and by simple sensitive vollume (SSV) model using the PHITS code. The SER calculated by PHITS-MSV is in good agreement with the SER obtained by PHYSERD. From the comparisons of the collected charges between TCAD simulation and SV model calculations for each single event, it is found that the accuracy of the SER calculation based on the MSV model is improved by considering the spatial dependence of the charge collection efficiency.
Tsubouchi, Masaaki; Nagashima, Keisuke; Yoshida, Fumiko; Ochi, Yoshihiro; Maruyama, Momoko
no journal, ,
The nonlinear interaction between terahertz (THz) light and matter has recently been of interest for its availability to control molecular alignment in space. The pulse train of the intense THz light is one of the candidates to align the molecules efficiently and nondestructively. In this study, we have developed the experimental apparatus to generate the intense THz light. The THz etalon to generate the THz pulse train has been presented in our previous study
Teraoka, Yuden
no journal, ,
no abstracts in English
Otobe, Tomohito; Shinohara, Yasushi*; Sato, Shunsuke*; Yabana, Kazuhiro; Bertsch, G. F.*
no journal, ,
We calculate the dynamical Franz-Keldysh effect (DFKE), the ultrafast change of the dielectric function by an intense laser field, employing the time-dependent density functional theory. Our result show that the time for the peak of the change of the dielectric function dose not coincide with the peak of the electric field. This difference decreases as the laser intensity increases. To explore this effect analytically, we construct the new time-resolved formula for DFKE. This formula reproduces our numerical results qualitatively.
Makino, Takahiro; Deki, Manato*; Onoda, Shinobu; Hoshino, Norihiro*; Tsuchida, Hidekazu*; Oshima, Takeshi
no journal, ,
no abstracts in English
Si crystals by sputter etchingHori, Nobuhiko*; Esaka, Fumitaka; Udono, Haruhiko*
no journal, ,
Magnesium half silicide is a semiconductor with an indirect energy gap of about 0.6 eV at room temperature. This material is attracting attention as a suitable material for Si-based infrared photo detector below 4 
m. In this study, the pn-junction depth was evaluated for the Ag diffused MgSi substrate using a conventional sputter etching. Surface of the sample was polished at a 3
off angle and etched by Ar
RF-sputtering. After the sputter etching, the etched surface was observed using an optical microscope. For the sample annealed for 3 min at 550C, Ag diffusion depth of about 36 m was determined from the width of Ag diffusion region observed as the contrast.
Kambayashi, Yuya; Onoda, Shinobu; Kada, Wataru*; Makino, Takahiro; Hoshino, Norihiro*; Tsuchida, Hidekazu*; Oshima, Takeshi; Kamiya, Tomihiro; Hanaizumi, Osamu*
no journal, ,
no abstracts in English
Haruyama, Moriyoshi; Onoda, Shinobu; Isoya, Junichi*; Kada, Wataru*; Hanaizumi, Osamu*; Oshima, Takeshi
no journal, ,
no abstracts in English
Onoda, Shinobu; Kambayashi, Yuya; Kada, Wataru*; Iwamoto, Naoya*; Makino, Takahiro; Umezawa, Hitoshi*; Mokuno, Yoshiaki*; Shikata, Shinichi*; Hanaizumi, Osamu*; Kamiya, Tomihiro; et al.
no journal, ,
no abstracts in English
Tamura, Shuto*; Koike, Godai*; Teraji, Tokuyuki*; Onoda, Shinobu; McGuinness, L.*; Rogers, L.*; Christoph, M.*; Naydenov, B.*; Wu, E.*; Yan, L.*; et al.
no journal, ,
no abstracts in English
Entani, Shiro; Naramoto, Hiroshi*; Sakai, Seiji
no journal, ,
O
thin films by ion beam sputter deposition methodFujita, Masaya*; Yamaguchi, Kenji; Asaoka, Hidehito; Mao, W.*; Chikada, Takumi*; Suzuki, Akihiro*; Terai, Takayuki*
no journal, ,
no abstracts in English
Koike, Masato; Imazono, Takashi; Koeda, Masaru*; Nagano, Tetsuya*; Sasai, Hiroyuki*; Oue, Yuki*; Yonezawa, Zeno*; Kuramoto, Satoshi*; Terauchi, Masami*; Takahashi, Hideyuki*; et al.
no journal, ,
In this study, in order to realize high sensitivity Li-K spectra measured in the plane imaging grating spectrographs equipped with the electron microscope, we designed Au/DLC multilayer diffraction gratings, i.e., the gratings are coated by dense diamond-like carbon (DLC) layer having a density of 3.1g/cm
on standard Au coating, to improve the diffraction efficiency. We assumed that the laminar grating is of groove density: 1200 lines/mm; duty ratio: 0.3; groove depth: 25 nm (or aspect ratio: 0.03). The results indicated that the maximum diffraction efficiency of the 1st-order light was obtained at the incidence angle of 80., and the value was 1.4 times at 54.3 eV as well as a higher diffraction efficiency over a wide energy region of 20-190 eV was obtained compared to the case of a standard Au coated grating.
7 reconstruction during Ge/Si heteroepitaxial growthUozumi, Yuki; Yamazaki, Tatsuya*; Asaoka, Hidehito
no journal, ,
no abstracts in English
Harii, Kazuya; Chudo, Hiroyuki; Ono, Masao; Matsuo, Mamoru; Ieda, Junichi; Okayasu, Satoru; Yasuoka, Hiroshi; Maekawa, Sadamichi; Saito, Eiji
no journal, ,
Spin angular momentum in a rotating body feels an interaction of the rotation. Recently, the interaction called the spin-rotation coupling was directly observed by spinning NMR measurements as the NMR frequency shifts. In the measurement, we can apply a time-dependent external field on the sample by tilting the rotation axis from an external magnetic filed, The time-dependent external field generates Berry phases and the Berry phases affect the NMR frequency. We report experimental and theoretical studies of the NMR frequency for the system in tilted rotation.
Oshima, Takeshi; Onoda, Shinobu; Makino, Takahiro; Iwamoto, Naoya*; Johnson, B. C.*; Lohrmann, A.*; Karle, T.*; McCallum, J. C.*; Castelletto, S.*; Umeda, Takahide*; et al.
no journal, ,
no abstracts in English
Imaizumi, Mitsuru*; Nakamura, Tetsuya*; Oshima, Takeshi
no journal, ,
no abstracts in English
-raysYokoseki, Takashi; Makino, Takahiro; Abe, Hiroshi; Onoda, Shinobu; Oshima, Takeshi; Tanaka, Yuki*; Kandori, Mikio*; Yoshie, Toru*; Hijikata, Yasuto*
no journal, ,
no abstracts in English